Schurmann, Jurgen <br/><br/>
Pattern classification :  a unified view of statistical and neural approaches / 
Jurgen Schurmann 
 - New York :  John Wiley,  c1996 
 - xvii, 371 p. ;  25 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0471135348 :  USD 64.95 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pattern recognition systems<br/>Pattern perception<br/>Neural networks (Computer science)<br/>Statistical decision
<br/><br/><label>Dewey Class. No.: </label>006.4