TY  - BOOK
AU  - Sirohi,Rajpal S.
TI  - Speckle metrology
SN  - 0824789326
U1  - 620.1127 
PY  - 1993///
CY  - New York
PB  - Marcel Dekker
KW  - Non-destractive testing
KW  - Speckle Metrology
N1  - Includes index; Includes bibliographical references: p. 537-538
ER  -