Speckle metrology/ 
edited by Rajpal S. Sirohi 
 - New York:  Marcel Dekker,  C1993 
 - xiii, 551 p.;  23 cm. 
<br/><br/> Includes index 
<br/><br/>Includes bibliographical references: p. 537-538 
<br/><br/><label>ISBN: </label>0824789326  $ 175.00 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Non-destractive testing<br/>Speckle Metrology
<br/><br/><label>Dewey Class. No.: </label>620.1127