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Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022, Proceedings / edited by Adam Krzyzak, Ching Y. Suen, Andrea Torsello, Nicola Nobile.

Contributor(s): Material type: TextTextSeries: Lecture Notes in Computer Science ; 13813Publisher: Cham : Springer International Publishing : Imprint: Springer, 2022Edition: 1st ed. 2022Description: XIII, 324 p. 118 illus., 93 illus. in color. online resourceISBN:
  • 9783031230288
Subject(s): DDC classification:
  • 006.3 23
Online resources: Summary: This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022. The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.
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Item type Current library Call number Materials specified Status Date due Barcode Item holds
E-Books E-Books National Library of India Online Resource 006.3 (Browse shelf(Opens below)) Available EBK000032911ENG
Total holds: 0

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022. The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.

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